The TX150E is a compact and ruggedized tester for installing, commissioning and troubleshooting SDH, PDH and T-Carrier networks. Configuration of the test setup is simplified by the color touchscreen, test system block diagram and intuitive menu structure and shortcuts. Electrical and optical signal levels, alarms, errors, overhead byte analysis and generation, histogram, and other test criteria and results can be quickly accessed with a stylus. The TX150e supports SDH/SONET, PDH, DS3 and DS1s signal mapping and multiplexing structures making it suitable for a global customer base. In addition, ITU performance measurements, E3/E1/DS3/DS1 pulse mask analysis, complete error/alarm injection, APS, Service Disruption, Tandem Connection Monitoring, Pointers, Trace Identifiers, >2000 test results storage and field changeable LiIon battery are all packed into this field friendly unit weighing in at less than 1kg. The TX150E is also the industrys first handheld SDH/PDH/T-Carrier Analyzer to offer Triple Play service verification functions on the standard Ethernet LAN interface. The unit can be remote controlled for monitoring applications and other offsite or remote tasks.

• Key Features include;
• PDH testing at E1, E3 bit rates. DS1, DS3 and E4 (Optional)
  
• Balanced (120©) and Unbalanced (75©) interfaces for E1
  
• Dual E1 Receivers for bi-directional monitoring
  
• Full Rate E1 and Fractional N, M x64 kbit/s testing
  
• PDH Analysis with Sa bit Generation
  
• Non intrusive Pulse Mask Analysis at E1, E3 and DS3 bit rates
  
• SDH testing at STM-1, STM-4 and STM-16 bit rates
  
• Flexible wavelength/bit rate options using industry standard SFPs conforming to the Multi Source
• Agreement (MSA)
  
• Optical Power, Level and Frequency measurements
  
• Auto Configuration of network type, bit rate, line coding, framing, mapping, and test pattern
  
• Payload Mapping according to ITU-T G.707 recommendations
  
• Concatenated Payloads
  
• Bit Error and Performance Analysis per ITU standards
  
• Error and Alarm Generation and Analysis
  
• Path Trace Generation and Analysis
  
• Pointer Generation and Analysis
  
• Automatic Protection Switching/Service Disruption testing
  
• Histogram and Event analysis for errors and alarms
  
• Round Trip Delay on all interfaces and payload mappings
  
• Transmit Frequency Offset to stress clock recovery circuits
  
• Section and Path Overhead Monitoring and Byte decoding
  
• Tandem Connection Monitoring

In Service Applications include;

• Optical Power and Frequency
  
• Tributary Scanning
  
• Performance Analysis per G.826, G.828, G.829, M.2101
  
• Pointer Analysis and Generation
  
• APS Measurement/Service Disruption
  
• Tandem Connection Monitoring
  
• Overhead Byte Control and Decode
  
• Overhead BERT
  
  

Out of Service Applications include;               

• End-to-end BERT                                            
  
• Tributary Mapping/de-apping                         
  
• Path/Section Trace Generation                         
  
• Bringing Into Service (M.2100)                         
  
• Pulse mask analysis (E1/E3/DS3)                     
  
• Mux Testing                                                    
  
• Round Trip Delay (RTD)